Shared Equipment List
"Katsuyui" is a base that connects research facilities located in each area to a network and promotes shared use. Equipment is listed by area and academic department (rough academic field), so please search the page using keywords such as purpose and facility name to find the equipment you are looking for.
- Katsura District A Cluster (Chemical, Electrical)
- Katsura District C Cluster (Earth Science, Architecture, Physics)
- Yoshida Area (Physics (Materials Engineering))
- Uji Area (Quantum Science and Engineering Center)
Katsura District A Cluster
Chemistry
Equipment name (manufacturer name) *Click to display detailed equipment information (Japanese version) |
Fee Regulations (Japanese version) Keywords |
---|---|
CTX-ray CT deviceFLEX-M345(X線CT装置 FLEX-M345) (BEAMSENSE Inc.) |
#3D structure analysis #Porous material #Microstructure |
Scanning Transmission Electron Microscope (STEM) JEM-2100F(走査型透過電子顕微鏡 JEM-2100F) (JEOL Ltd.) |
#Composition analysis #Mapping #Inorganic particles #Metal particles |
Fourier Transform Nuclear Magnetic Resonator ECX400KUM(フーリエ変換核磁気共鳴装置 JNM-ECX400KUM) (JEOL Ltd.) |
#Multinuclear measurement #2D NMR |
Laser cutting / drilling equipment LDSD-3000M(レーザー切断・穴あけ加工装置 LDSD-3000M) (LTS Co., Ltd.(South Korea)) |
#Drilling #Marking #Surface treatment |
Soft Material Tertiary Structural Analysis System JEM-1400 and others(ソフトマテリアル三次元構造解析システム JEM-1400他) (JEOL Ltd.) |
#Electron microscope #TEM #EDS #STEM |
Chemistry Mass Spectrometer Room
Equipment name (manufacturer name) *Click to display detailed equipment information(Japanese version) |
Fee Regulations (Japanese version) Keywords |
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Ultra-high resolution Fourier transform mass spectrometry system Exactive Plus(超高分解能フーリエ変換型質量分析システム Exactive Plus) (Thermo Fisher Scientific Inc.(USA)) |
#QualityAnalysis #PrecisionQuality #HRMS #LC-MS |
Chemistry Incubation Core Lab
Equipment name (manufacturer name) *Click to display detailed equipment information(Japanese version) |
Fee Regulations (Japanese version) Keywords |
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Bench-top FT-IR Infrared Spectrophotometer(ベンチトップFT-IR赤外分光光度計 Nicolet iS50) (Thermo Fisher Scientific Inc.(USA)) |
#Materials analysis #Raman spectroscopy #organic materials |
Ultra-high resolution field emission scanning electron microscope (FE-SEM)(超高分解能電界放出形走査電子顕微鏡(FE-SEM) Regulus8220) (Hitachi High-Technologies Corporation) |
#Nanomaterials #Composition analysis #Surface observation |
Pulsed laser processing system(パルスレーザー加工システム) ※Suspended ・Femtosecond Laser FREGAT(フェムト秒レーザー) (Avesta Project Ltd.(Russia)) ・Picosecond laser ATLANTIC(ピコ秒レーザー ATLANTIC) (EKSPLA Ltd.(Lithuania)) |
#Ultrashort pulse laser #Microfabrication ※Suspended |
Spatial light modulator (LCOS-SLM X10468 series)(空間光変調器(LCOS-SLM) X10468 series) (HAMAMATSU PHOTONICS K.K.) |
#Phase modulation #Wavefront correction |
Focused ion beam / scanning electron microscope processing observation device(集束イオンビーム・走査型電子顕微鏡加工観察装置 JIB-4600F他) (JEOL Ltd.) |
#Nanostructure observation #Microfabrication #Elemental analysis |
Supercritical dryer SCRD4(超臨界乾燥装置 SCRD4) (Rexxam Co., Ltd.) |
#Supercritical state #Cleaning |
Scanning probe microscope(走査型プローブ顕微鏡 MultiMode8J-KM1603他) (Bruker Nano Inc.(USA)) |
#Surface shape measurement #Surface property measurement |
Micro CT for small animals(小動物用マイクロCT SKYSCAN 1272) (Bruker Corp.(USA)) |
#X-ray microscope #3D imaging #biological specimens #microstructure #life sciences |
Real-time PCR system(リアルタイムPCRシステム QuantStudio 7 Pro) (Thermo Fisher Scientific Inc.(USA)) |
#Real-time PCR #Gene expression #Protein expression analysis #Genomic applications |
Tabletop Atmospheric Pressure Electron Microscope(卓上大気圧電子顕微鏡 AeroSurf 1500) (Hitachi High-Tech Corporation) |
#Scanning electron microscope, #SEM #Atmospheric pressure observation #Wet sample observation |
Multi-Sample Nanoparticle Sizing System(多検体ナノ粒子径測定システム nanoSAQLA) (Otsuka Electronics Co., Ltd.) |
#Particle size measurement #Dynamic light scattering method #Nanoparticles |
Automated X-ray diffractometer SmartLab(全自動多目的X線回折装置 SmartLab) (Rigaku Corporation) |
#Powder X-ray diffraction #Thin film X-ray #Powder unknown structure analysis #Rietveld method |
Mass spectrometry system SCIEX X500R QTOF(質量分析システム X500R QTOF) ※In preparation (AB Sciex Co., Ltd.) |
#LC-MS/MS、#IDA、#SWATH、#HRMS ※In preparation |
Ultra-fine periodic structure analysis system NANO-Viewer(極微細周期構造解析システム NANO-Viewer) (Rigaku Corporation) |
#Small-angle X-ray scattering #SAXS #X-ray diffraction #lamella |
400MHzFourier transform nuclear magnetic resonance apparatusJNM-ECZ400S(400MHzフーリエ変換核磁気共鳴装置 JNM-ECZ400S) ※Inpreparation (JEOL Ltd.) |
#Nuclear magnetic resonance #Structural analysis #Variable temperature measurement #Reaction rate analysis #Diffusion coefficient analysis ※In preparation |
Time-resolved absorption spectroscopy system(時間分解吸収分光解析システム) (HAMAMATSU PHOTONICS K.K.) |
#Transient absorption #Transient emission #Excited state #Spectral analysis |
Transmission Electron Microscopy(TEM)(透過型電子顕微鏡(TEM)) ※In preparation |
※In preparation |
Electrical
Equipment name (manufacturer name) *Click to display detailed equipment information(Japanese version) |
Fee Regulations (Japanese version) Keywords |
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Wedge wire bonder (7600D specification)(超音波熱圧着ディープアクセスウエッジワイヤーボンダー) ※Suspended (WestBond, Inc.(USA)) |
※Suspended |
General-purpose 3D structural data high-precision collection and modeling system(汎用3D構造データ高精度収集・造形システム) ・3D scanning system(3Dスキャニングシステム Geomagic Capture)(3D Systems Corp.(USA)) ・Gypsum modeling printer(石膏造形プリンタ Projet 260C) (3D Systems Corp.(USA))※Suspended ・Resin modeling printer(樹脂造形プリンタ Projet 3500 HD Max) (3D Systems Corp.(USA))※Suspended ・Hitachi MR Imaging Equipment(日立MRイメージング装置) AIRIS Vento(Hitachi, Ltd.) |
#3D printer #3D scanner #open MRI #low field MRI |
X-ray diffractometer SLX2000(X線回折装置 SLX2000) (Rigaku Corporation) |
#Crystal structure evaluation #Plane spacing evaluation #Orientation evaluation |
AC-Hall measuring device Resitest 8300(AC-Hall測定装置 Resitest 8300) (Toyo Corporation) |
#Polarity determination, #Carrier density #Mobility #Resistivity |
Semiconductor crystal growth equipment HR-3216(半導体結晶成長装置 HR-3216) ※In preparation (TAIYO NIPPON SANSO CORPORATION) |
※In preparation |
Plasma CVD Equipment PD-220(プラズマ CVD 装置 PD-220) ※In preparation (Samco Inc.) |
※In preparation |
Electron beam exposure equipment JBX-6300 etc.(電子ビーム露光装置 JBX-6300 等) ※In preparation (JEOL Ltd.) |
※In preparation |
Electron beam exposure device JBX-9400#1 etc.(電子ビーム露光装置 JBX-9400#1 等) ※In preparation (JEOL Ltd.) |
※In preparation |
Electron beam exposure equipment JBX-9400#2 etc.(電子ビーム露光装置 JBX-9400#2 等) ※In preparation (JEOL Ltd.) |
※In preparation |
Plasma etching equipment RIE-41iPK(プラズマエッチング装置 RIE-41iPK) ※In preparation (Samco Inc.) |
※In preparation |
Plasma etching equipment ICP110iPKU(プラズマエッチング装置 ICP110iPKU) ※In preparation (Samco Inc.) |
※In preparation |
Plasma etching equipment RIE-200ku(プラズマエッチング装置 RIE-200ku) ※In preparation (Samco Inc.) |
※In preparation |
Plasma etching equipment RIE-200kuS(プラズマエッチング装置 RIE-200kuS) ※In preparation (Samco Inc.) |
※In preparation |
Plasma etching equipment RIE-400iPNK(プラズマエッチング装置 RIE-400iPNK) ※In preparation (Samco Inc.) |
※In preparation |
Reactive ion etching equipment RIE-10NR-KU(反応性イオンエッチング装置 RIE-10NR-KU) ※In preparation (Samco Inc.) |
※In preparation |
Scanning electron microscope S-4800EDX(走査型電子顕微鏡 S-4800EDX) ※In preparation (Hitachi High-Technologies Corporation) |
※In preparation |
Scanning electron microscope Regulus8220(走査型電子顕微鏡 Regulus8220) ※In preparation (Hitachi High-Technologies Corporation) |
※In preparation |
light exposure equipment DL-1000KIR(光露光装置 DL-1000KIR) ※In preparation (NanoSystem Solutions, Inc.) |
※In preparation |
light exposure equipment DDB-701-DL4-FBT etc.(光露光装置 DDB-701-DL4-FBT 等) ※In preparation (NEOARK CORPORATION) |
※In preparation |
Electron beam evaporation equipment ED-1500(電子ビーム蒸着装置 ED-1500) ※In preparation (SANVAC CO.,LTD.) |
※In preparation |
Electron beam evaporation equipment Multiple simultaneous electron beam evaporation equipment(電子ビーム蒸着装置 多元同時電子ビーム蒸着装置) ※In preparation (SANVAC CO.,LTD.) |
※In preparation |
Plating equipment Thick film electrode forming equipment for large-area photonic crystal lasers(メッキ装置 大面積フォトニック結晶レーザー用厚膜電極形成装置) ※In preparation (Hitachi Power Solutions Co., Ltd.) |
※In preparation |
Grinding/polishing equipment FAM-12BS#1(研削・研磨装置 FAM-12BS#1) ※In preparation (SpeedFam Company Limited) |
※In preparation |
Grinding/polishing equipment FAM-12BS#2(研削・研磨装置 FAM-12BS#2) ※In preparation (SpeedFam Company Limited) |
※In preparation |
Dicing equipment with pure water recycling unit(ダイシング装置 純水リサイクルユニット付きダイシング装置) ※In preparation (Disco Corporation) |
※In preparation |
Scribing device DPS-301R-KU(スクライブ装置 DPS-301R-KU) ※In preparation (Daitron Co., Ltd.) |
※In preparation |
Flip chip bonding equipment MODEL4200-KU(フリップチップボンディング装置MODEL4200-KU) ※In preparation (HiSOL,Inc.) |
※In preparation |
Flip chip bonding equipment KMP400(フリップチップボンディング装置KMP400) ※In preparation (HiSOL,Inc.) |
※In preparation |
Wire bonding equipment model 7476D(ワイヤボンディング装置 モデル 7476D) ※In preparation (WestBond, Inc.(USA) |
※In preparation |
Wire bonding equipment model 4KE(ワイヤボンディング装置 モデル 4KE) ※In preparation (WestBond, Inc.(USA)) |
※In preparation |
Sealing device Inverter type welding machine(封止装置 インバータ式溶接機) ※In preparation (HIMAX CORPORATION) |
※In preparation |
Katsura District C Cluster
Earth Science
Equipment name (manufacturer name) *Click to display detailed equipment information(Japanese version) |
Fee Regulations (Japanese version) Keywords |
---|---|
6-axis control type driving simulator(6軸制御型ドライビングシミュレータ UC-win/Road) (FORUM8 Co., Ltd.) |
#Driving behavior #Laboratory experiments #Virtual reality #Road safety |
(Thermo Fisher Scientific Inc.(USA)) |
#massanalysis #precisionmass #LC-MS/MS |
ICP Mass Spectrometer (ICP-MS)(ICP質量分析計(ICP-MS) NexION1000) (PerkinElmer Inc.(USA)) |
#Elemental analysis, #Quantitative analysis #He-KED |
X-ray diffraction analyzer (XRD)(X線回折装置(XRD) RINT-Ultima+/PCQ2) (Rigaku Corporation) |
#PowderX-ray foldback #crystallization |
Microlaser Raman spectroscope(顕微レーザーラマン分光装置 LabRAM HR Evolution) (HORIBA, Ltd.) |
#Raman scattering light #non-destructive testing #mapping measurement #imaging |
Scanning electron microscope JSM6390LV(走査電子顕微鏡 JSM-6390LV) (JEOL Ltd.) |
#Surface shape observation #Microstructure #Low vacuum |
Geomaterial visualization device + FPD, work table(ジオマテリアル可視化装置+FPD,ワークテーブル) (TOSHIBA IT & CONTROL SYSTEMS CORPORATION) |
#Microfocus #3D internal structure #Nondestructive measurement |
Architecture
Physics
Equipment name (manufacturer name) *Click to display detailed equipment information(Japanese version) |
Fee Regulations (Japanese version) Keywords |
---|---|
High resolution RBS device(高分解能RBS装置) (Kobe Steel, Ltd.) |
#Ion scattering analysis #Ultra-thin film #Elemental composition #Non-destructive depth analysis |
Scanning electron microscope (FE-SEM) SU-8020(走査型電子顕微鏡(FE-SEM) SU-8020) (Hitachi High-Technologies Corporation) |
#Surface shape observation #microstructure #film thickness measurement |
Atomic Force Microscope NanoWizard3(原子間力顕微鏡 NanoWizard3) (JPK Instruments AG(Germany)) |
#Surface shape observation #microstructure #surface property measurement |
Yoshida area
Physics(Materials Science and Engineering)
Equipment name (manufacturer name) *Click to display detailed equipment information(Japanese version) |
Fee Regulations (Japanese version) Keywords |
---|---|
(HORIBA, Ltd.) |
#GD-OES #depth profile #qualitative analysis #surface analysis |
X-ray photoelectron spectrometer JPS-9010TRX(全反射X線光電子分光装置 JPS-9010TRX) (JEOL Ltd.) |
#XPS, #ESCA, #Solid surface analysis #Chemical state analysis |